Advancing the State of the Art for RF GaN HEMT Radiation Hardness Assurance

An RF GaN HEMT space qualification guideline developed collaboratively by the vested community and released this year highlights core uncertainties in RHA methods. We will conduct controlled tests in FY21 to answer whether the RF GaN HEMT worst-case radiation test state is RF powered or if a simpler DC state can bound the susceptibility to galactic cosmic ray induced catastrophic single-event failure. These tests will also advance our understanding of device parameters that increase failure susceptibility. Whereas heavy ion testing for single event effects (SEE) is the preferred method, it is expensive and facility availability limitations introduce months-long delays. We propose to use pulsed laser testing as a potentially analogous method for SEE testing at a dramatically lower price point and greatly improved accessibility.

The goal of developing RF GaN HEMT radiation hardness assurance (RHA) efficiencies and expertise in the absence of test standards is needed to keep pace with the increasing NASA demand for RF GaN usage in communication and science applications. Unanswered questions remain regarding device susceptibility to catastrophic radiation effects and how to most efficiently test for these effects as part of their space qualification. This activity will address these questions.

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