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In-space X-ray Analyzer

Completed TRL 3 (started at 2, targeting 3)

Description

To meet the NASA’s needs for in-space inspection, Advanced Analyzer Labs, Inc. (AAL) proposes an innovative X-ray analyzer. This analyzer is designed to be portable, compact, low power, safe, light weight, flexible, and highly efficient for conducting the following None-destructive Evaluation (NDE) tests using X-ray Diffraction (XRD), X-ray Fluorescence (XRF), and X-ray imaging. Inspection of additively manufactured parts in space. Detection of commonly known defects in materials. Analysis of regolith/drill core samples The key innovation of this X-ray analyzer is the utilization of a large, intensive collimating X-ray beam, with a diameter of up to 15mm, to facilitate flexible XRD, XRF, and X-ray imaging measurements. The parallel beam geometry of the analyzer enhances the reliability and efficiency of XRD and XRF measurements and improves the flexibility and efficiency of X-ray imaging. The significant innovation of this analyzer is: Highly efficient and reliable from using one compact X-ray source and parallel beam geometry. Simple and flexible configuration to implement multiple NDE X-ray functions. Safe due to the collimating beam is easy to constrain. Portable and flexible for in-situ and in-field tests of AM parts, and other components/samples. The compact size, lightweight, low power consumption, safety, flexibility, and multiple capabilities of the X-ray analyzer make it a highly desirable tool for NASA's in-space inspection needs.

Benefits

NASA is seeking new None-destructive Evaluation (NDE) tools for astronauts to use in a habitat or in the space environment. This proposed analyzer can be used for the following in-space NDE tests for the NASA applications: Inspection of additively manufactured parts in space. Detection of commonly known defects in materials. Analysis of regolith/drill core samples through X-ray Diffraction (XRD), X-ray Fluorescence (XRF), and X-ray imaging.

This X-ray analyzer technology with XRD, XRF and X-ray imaging brings a totally new Quality Assurance (QA) and Quality Control (QC) tool for a variety of industrious applications, which include the fast-growing Additive Manufacturing (AM) in the aerospace industry, the automotive industry, consumer products, healthcare, government and defense etc.

Details

Technology areaSensors and Instruments > Remote Sensing Instruments and Sensors > Detectors and Focal Planes
ProgramSmall Business Innovation Research/Small Business Tech Transfer (SBIR/STTR)
Lead organizationAdvanced Analyzer Labs, Inc., Ellicott City, MD
Start date2023-08-03
End date2024-02-02

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