In-Space Portable Multi-Functional Intelligent Evaluation Tool

To support NASA needs for in-space non-destructive evaluation (NDE) tools, Intellisense Systems, Inc. (Intellisense) proposes to develop a new small-size, lightweight, and battery-powered In-Space Portable Multi-Functional Intelligent Evaluation Tool (SMIET) based on Compton imaging tomography (CIT). SMIET’s innovative application of CIT for in-space in situ NDE provides three-dimensional (3D) visualization while its artificial intelligence enables true characterization of various defects/irregularities of in-space large multilayered components/structures with complex 3D geometries such as truss, stiffened, and welded and/or bonded structures fabricated using combinations of various aerospace materials including Inconel, titanium, aluminum, carbon fiber, thermoplastic composites, lunar regolith, and thermal blanket structures. SMIET performs volumetric NDE of space-based components/structures, estimates their in-depth integrity, and detects, identifies, and localizes defects/irregularities such as cracks, voids, delaminations, porosity, inclusions, micrometeoroid damages, and foreign object debris. SMIET can be used for the NDE of platforms on International Space Station and on planetary missions. Astronauts can use SMIET in a habitat or the space environment (i.e., on an extravehicular activity) or for automated inspection. In Phase I, Intellisense will demonstrate the feasibility of SMIET using a laboratory prototype, document SMIET’s ability to detect structural defects/irregularities in terms of resolution, sensitivity, and speed of operation. We will describe SMIET’s Phase II prototype and its application to the NDE of spacecraft components/structures. In Phase II, Intellisense will develop a full working prototype of SMIET along with plans for transition and commercialization. Intellisense expects the prototype to reach technology readiness level 6 by the end of Phase II.

SMIET will primarily be a non-destructive evaluation (NDE) system on the International Space Station (ISS), other space missions, and future space habitats, focusing on the NDE of in-space multilayered components and structures with complicated 3D geometries such as truss, stiffened and welded and/or bonded structures. SMIET can be applied to combinations of various aerospace materials such as Inconel, titanium, aluminum, carbon fiber, thermoplastic composites, Avcoat, Alumina Enhanced Thermal Barrier (AETB), Phenolic Impregnated Carbon Ablator (PICA), lunar regolith, and thermal blanket structures. SMIET’s artificial intelligence/machine learning can perform intelligent detection, identification, and spatial localization of defects/irregularities including cracks, voids, delaminations, porosity, inclusions, micrometeoroid damages, foreign object debris (FOD). SMIET can also be used for the NDE of components/structures including platforms on lunar surface, Gateway, Martian, and other planetary missions. Astronauts can use SMIET in a habitat or in the space environment (i.e., on an extravehicular activity (EVA)) or for automated inspection. As a conventional NDE tool, SMIET can be used for in-situ NDE of any type of large aircraft/spacecraft, rocket, and multilayered components/structures with complicated 3D geometries by retraining the artificial intelligence algorithms for these new structures and inspection criteria. SMIET could be used for NDE, nondestructive inspection (NDI) and nondestructive testing (NDT) of aerospace systems and components already deployed in the field. With minimum modifications, SMIET can be applied for the NDE of additive manufacturing (AM) parts production process. The growing need for NDE systems to test a product at all stages of the product’s lifecycle provides ample opportunities for SMIET.

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