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Study of mechanical and oxidative impacts of PTFE soft goods in valve assemblies used for NTO sampling
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Description
Proposal will produce material characterization data of PTFE seals after NTO exposure to inform decisions for reuse of current sampling equipment and critical data for future fabrication assessments. The proposal will evaluate mechanical stress, polymeric degradation, physical degradation, and long term offgassing.
Benefits
Reduce operating cost for oxidizer systems and remove risk for valve damage by reducing maintenance operations. Characterize the lifecycle of PTFE after exposure to NTO (Nitrogen Tetroxide)
Details
| Technology area | Ground, Test, and Surface Systems > Other Ground, Testing, and Surface Systems |
| Program | Agency Independent Research and Development (A-IRAD) |
| Lead organization | Kennedy Space Center, Kennedy Space Center, FL |
| Start date | 2025-11-01 |
| End date | 2026-09-30 |
Project contacts
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How to get involved
This is a mature technology (TRL 7+) — the realistic path in is usually NASA's Technology Transfer Program: licensing an existing NASA patent, or a Space Act Agreement to use NASA facilities/expertise directly. NASA also runs a startup licensing program with no upfront fee for companies formed to commercialize a specific NASA technology.
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