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Study of mechanical and oxidative impacts of PTFE soft goods in valve assemblies used for NTO sampling

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Description

Proposal will produce material characterization data of PTFE seals after NTO exposure to inform decisions for reuse of current sampling equipment and critical data for future fabrication assessments. The proposal will evaluate mechanical stress, polymeric degradation, physical degradation, and long term offgassing.

Benefits

Reduce operating cost for oxidizer systems and remove risk for valve damage by reducing maintenance operations. Characterize the lifecycle of PTFE after exposure to NTO (Nitrogen Tetroxide)

Details

Technology areaGround, Test, and Surface Systems > Other Ground, Testing, and Surface Systems
ProgramAgency Independent Research and Development (A-IRAD)
Lead organizationKennedy Space Center, Kennedy Space Center, FL
Start date2025-11-01
End date2026-09-30

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This is a mature technology (TRL 7+) — the realistic path in is usually NASA's Technology Transfer Program: licensing an existing NASA patent, or a Space Act Agreement to use NASA facilities/expertise directly. NASA also runs a startup licensing program with no upfront fee for companies formed to commercialize a specific NASA technology.

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